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Optical <t>microscope</t> images (A)–(D) and SEM cross-sectional images (a)–(d) of OPSZ layers on PEN substrate.
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Optical microscope images (A)–(D) and SEM cross-sectional images (a)–(d) of OPSZ layers on PEN substrate.

Journal: RSC Advances

Article Title: Fabrication and characterization of an Al 2 O 3 /OPSZ/Al 2 O 3 barrier film on a PEN substrate via PEALD and spray-spin coating techniques

doi: 10.1039/d4ra08383k

Figure Lengend Snippet: Optical microscope images (A)–(D) and SEM cross-sectional images (a)–(d) of OPSZ layers on PEN substrate.

Article Snippet: The microstructures of the films at varying preparation steps were characterized by applying a Scanning Electron Microscope (SEM, Nova NanoSEM 450, FEI Company).

Techniques: Microscopy